Intensity Correction in Texture Measurement of Polycrystalline Thin Films by X-Ray Diffraction
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Textures and Microstructures
سال: 2003
ISSN: 0730-3300,1029-4961
DOI: 10.1080/07303300310001597035